SPIE Proceedings [SPIE Optics & Photonics - San Diego, CA (Sunday 13 August 2006)] Advances in X-Ray/EUV Optics, Components, and Applications - Optical constants in the EUV soft x-ray (5÷152 nm) spectral range of B4C thin films deposited by different deposition techniques

✍ Scribed by Monaco, G.; Garoli, D.; Frison, R.; Mattarello, V.; Nicolosi, P.; Pelizzo, M. G.; Rigato, V.; Armelao, L.; Giglia, A.; Nannarone, S.; Khounsary, Ali M.; Morawe, Christian

• Book ID: 111677473
• Publisher: SPIE
• Year: 2006
• Weight: 529 KB
• Volume: 6317
• Category: Article
• DOI: 10.1117/12.684088