SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 10 August 2008)] Advances in X-Ray/EUV Optics and Components III - Innovative approaches to surface sensitive analysis techniques on the basis of plasma-based off-synchrotron XUV/EUV light sources

✍ Scribed by Banyay, Matus; Juschkin, Larissa; Goto, Shunji; Khounsary, Ali M.; Morawe, Christian

• Book ID: 120482933
• Publisher: SPIE
• Year: 2008
• Weight: 1020 KB
• Volume: 7077
• Category: Article
• DOI: 10.1117/12.793364