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SPIE Proceedings [SPIE Micromachining and Microfabrication - San Jose, CA (Saturday 25 January 2003)] MOEMS and Miniaturized Systems III - Thin-film-technology-based micro-Fourier spectrometer

✍ Scribed by Knipp, Dietmar; Stiebig, Helmut; Bhalotra, Sameer R.; Kung, Helen L.; Miller, David A. B.; Smith, James H.

No coin nor oath required. For personal study only.

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