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SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Vision Systems: Applications - Weaving defect detection by Fourier imaging

✍ Scribed by Ciamberlini, Claudio; Francini, Franco; Longobardi, Giuseppe; Poggi, Pasquale; Sansoni, Paola; Tiribilli, Bruno; Kammenos, Panayotis A.; Nickolay, Bertram

Book ID: 121498975
Publisher: SPIE
Year: 1996
Weight: 603 KB
Volume: 2786
Category: Article
DOI: 10.1117/12.248573

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