✦ LIBER ✦

SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Optical Inspection and Micromeasurements - Micronic intensity analysis and imaging in laser optics by means of micro-thermoelectrical sensors

✍ Scribed by Thiery, Laurent; Prenel, Jean-Pierre; Gorecki, Christophe

No coin nor oath required. For personal study only.

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