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SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Micro-Optical Technologies for Measurement, Sensors, and Microsystems - Feedback interferometry with semiconductor laser for high-resolution displacement sensing

✍ Scribed by Donati, Silvano; Merlo, Sabina; Micolano, Francesco; Parriaux, Olivier M.

No coin nor oath required. For personal study only.

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