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SPIE Proceedings [SPIE International Symposium on Precision Engineering Measurement and Instrumentation 2012 - Chengdu, China (Wednesday 8 August 2012)] Eighth International Symposium on Precision Engineering Measurement and Instrumentation - Methodologies for measuring residual stress distributions in epitaxial thin films

โœ Scribed by Liu, M.; Ruan, H. H.; Zhang, L. C.; Lin, Jie

Book ID
120263336
Publisher
SPIE
Year
2013
Weight
953 KB
Volume
8759
Category
Article

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