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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments - Precision measurement facility of mid-infrared spectral emissivity measurement

✍ Scribed by Feng, Guojin; Wang, Yu; Li, Ping; Guo, Tingliang; Guo, Tingting

Book ID: 120979087
Publisher: SPIE
Year: 2011
Weight: 260 KB
Volume: 8197
Category: Article
DOI: 10.1117/12.905503

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