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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Research on a multiplexed interferometry technique for absolute displacement measurement

✍ Scribed by Ma, Sen; Xie, Fang; Li, Zhaoying

Book ID: 120035288
Publisher: SPIE
Year: 2011
Weight: 200 KB
Volume: 8201
Category: Article
DOI: 10.1117/12.906084

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