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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments - An experimental apparatus for normal spectral emissivity measurement

โœ Scribed by Yu, Kun; Liu, Yufang; Jia, Guangrui; Shi, Deheng

Book ID
118245741
Publisher
SPIE
Year
2011
Weight
377 KB
Volume
8197
Category
Article

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