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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2011) - Beijing, China (Sunday 6 November 2011)] 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology - An automatic peak detection algorithm for Raman spectroscopy based on wavelet transform

✍ Scribed by Cai, Zhijian; Wu, Jianhong; Yoshizawa, Toru; Wei, Ping; Zheng, Jesse

Book ID: 115497273
Publisher: SPIE
Year: 2011
Weight: 647 KB
Volume: 8200
Category: Article
DOI: 10.1117/12.904862

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