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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Research on chromatic dispersion measurement of PCF based on Michelson white-light interferometry

✍ Scribed by Jia, Dagong; Zhu, Yong; Shi, Feng; Zhang, Xuemin; Zhang, Hongxia; Jing, Wencai; Zhang, Yimo; Ye, Shenghua; Zhang, Guangjun; Ni, Jun

Book ID: 120418266
Publisher: SPIE
Year: 2009
Weight: 254 KB
Volume: 7511
Category: Article
DOI: 10.1117/12.837453

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