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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems - Measurement of the laser beam quality using knife-edge method

✍ Scribed by Wen, Ji-hua; Jia, Li-ping; Zhu, Yue-hong; Ye, Shenghua; Zhang, Guangjun; Ni, Jun

Book ID: 120621081
Publisher: SPIE
Year: 2009
Weight: 361 KB
Volume: 7511
Category: Article
DOI: 10.1117/12.837570

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