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SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose, CA (Sunday 18 January 2004)] Machine Vision Applications in Industrial Inspection XII - Camera calibration, data segmentation, and fitting approaches for a visual edge inspection system

✍ Scribed by Tratnig, Mark; O'Leary, Paul; Hlobil, Helmut; Reisinger, Johann; Price, Jeffery R.; Meriaudeau, Fabrice

No coin nor oath required. For personal study only.

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