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SPIE Proceedings [SPIE Electronic Imaging 2004 - San Jose, CA (Sunday 18 January 2004)] Machine Vision Applications in Industrial Inspection XII - CCD cameras as thermal imaging Devices in heat treatment processes

✍ Scribed by Zauner, Gerald; Heim, Daniel; Niel, Kurt; Hendorfer, Gunther; Stoeri, Herbert; Price, Jeffery R.; Meriaudeau, Fabrice

No coin nor oath required. For personal study only.

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