SPIE Proceedings [SPIE Photonics West 2001 - Electronic Imaging - San Jose, CA (Saturday 20 January 2001)] Machine Vision Applications in Industrial Inspection IX - Design and implementation of a dual-energy x-ray imaging system for organic material detection in an airport security application

✍ Scribed by Macdonald, Richard D. R.; Hunt, Martin A.

• Book ID: 120398743
• Publisher: SPIE
• Year: 2001
• Weight: 592 KB
• Volume: 4301
• Category: Article
• DOI: 10.1117/12.420922