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SPIE Proceedings [SPIE AeroSense 2000 - Orlando, FL (Monday 24 April 2000)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V - Search for optimal infrared projector nonuniformity correction procedures: II

✍ Scribed by Swierkowski, Leszek; Williams, Owen M.; Murrer, Jr., Robert Lee

No coin nor oath required. For personal study only.

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