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SPIE Proceedings [SPIE AeroSense 2003 - Orlando, FL (Monday 21 April 2003)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII - Infrared projector flood nonuniformity correction characteristics

✍ Scribed by Joyce, Robert A.; Swierkowski, Leszek; Williams, Owen M.; Murrer, Jr., Robert Lee

No coin nor oath required. For personal study only.

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