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SPIE Proceedings [SPIE AeroSense 2003 - Orlando, FL (Monday 21 April 2003)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII - Array nonuniformity correction: new procedures designed for difficult measurement conditions

✍ Scribed by Sieglinger, Breck A.; Norman, James D.; Meshell, William M.; Flynn, David S.; Thompson, Rhoe A.; Goldsmith II, George C.; Murrer, Jr., Robert Lee

Book ID: 121341201
Publisher: SPIE
Year: 2003
Weight: 504 KB
Volume: 5092
Category: Article
DOI: 10.1117/12.488620

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