SPIE Proceedings [SPIE AeroSense 2000 - Orlando, FL (Monday 24 April 2000)] Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V - High-fidelity synthetic IR imaging model

✍ Scribed by Wegener, Michael; Drake, Richard; Murrer, Jr., Robert Lee

• Book ID: 121341149
• Publisher: SPIE
• Year: 2000
• Weight: 143 KB
• Volume: 4027
• Category: Article
• DOI: 10.1117/12.391701