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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Eliminating noises contained in sensing signals from a self-mixing laser diode

✍ Scribed by Yu, Yanguang; Mei, Tiemin; Xi, Jiangtao; Chicharo, Joe F.; Ye, Huiying; Wang, Zhao; Zhang, Yudong; Sasián, José; Xiang, Libin; To, Sandy

Book ID
120501285
Publisher
SPIE
Year
2010
Weight
461 KB
Volume
7656
Category
Article

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