๐”– Bobbio Scriptorium
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SPIE Proceedings [SPIE 4th International Conference on Thin Film Physics and Applications - Shanghai, China (Monday 8 May 2000)] Fourth International Conference on Thin Film Physics and Applications - Structural, infrared, x-ray photoelectron, and Raman spectral characterization of electrochromic nickel oxide films

โœ Scribed by Wu, Yonggang; Wu, Guangming; Ni, Xingyuan; Wu, Xiang; Chu, Junhao; Liu, Pulin; Chang, Yong


Book ID
120587981
Publisher
SPIE
Year
2000
Weight
238 KB
Volume
4086
Category
Article

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