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SPIE Proceedings [SPIE 4th International Conference on Thin Film Physics and Applications - Shanghai, China (Monday 8 May 2000)] Fourth International Conference on Thin Film Physics and Applications - Characterization of the critical behavior of Ising thin films

✍ Scribed by Marques, Manuel I.; Gonzalo, Julio A.; Romero, Juan; Fonesca, Luis F.; Chu, Junhao; Liu, Pulin; Chang, Yong

Book ID: 120475581
Publisher: SPIE
Year: 2000
Weight: 419 KB
Volume: 4086
Category: Article
DOI: 10.1117/12.408405

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