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SPIE Proceedings [SPIE 4th International Conference on Thin Film Physics and Applications - Shanghai, China (Monday 8 May 2000)] Fourth International Conference on Thin Film Physics and Applications - Polarization properties of AlN single crystalline film

✍ Scribed by Yuan, Yifang; Chen, Baoxue; Qiu, Shaofeng; Chen, Lin; Chu, Junhao; Liu, Pulin; Chang, Yong

Book ID: 121197315
Publisher: SPIE
Year: 2000
Weight: 243 KB
Volume: 4086
Category: Article
DOI: 10.1117/12.408378

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