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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Method for computer-aided alignment of complex optical system

✍ Scribed by Yang, Xiaofei; Han, ChangYuan; Yu, Jingchi; Hou, Xun; Yuan, Jiahu; Wyant, James C.; Wang, Hexin; Han, Sen

Book ID: 115472437
Publisher: SPIE
Year: 2006
Weight: 654 KB
Volume: 6150
Category: Article
DOI: 10.1117/12.676512

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