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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Measurement of low loss and mirrors' reflectivity using cavity ring down spectroscopy with high accuracy

✍ Scribed by Yang, Dexing; Jiang, Yajun; Zhao, Jianlin; Di, Nan; Hou, Xun; Yuan, Jiahu; Wyant, James C.; Wang, Hexin; Han, Sen

Book ID: 111972756
Publisher: SPIE
Year: 2006
Weight: 392 KB
Volume: 6150
Category: Article
DOI: 10.1117/12.677964

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