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SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Study on charge carrier recombination zone with ultrathin rubrene layer as probe

✍ Scribed by Wen, Wen; Yu, Jungsheng; Li, Yi; Li, Lu; Jiang, Yadong; Yang, Li; Schoen, John M.; Namba, Yoshiharu; Li, Shengyi

Book ID: 118184028
Publisher: SPIE
Year: 2009
Weight: 355 KB
Volume: 7282
Category: Article
DOI: 10.1117/12.831025

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