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SPIE Proceedings [SPIE 1986 International Symposium/Innsbruck - Innsbruck, Austria (Tuesday 15 April 1986)] Thin Film Technologies II - Ellipsometric Methods of Characterization of Optical Thin Films

✍ Scribed by Azzam, R M. A.; Jacobsson, J. Roland

Book ID: 120831854
Publisher: SPIE
Year: 1986
Weight: 144 KB
Volume: 652
Category: Article
DOI: 10.1117/12.938378

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