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SPIE Proceedings [SPIE 1986 International Symposium/Innsbruck - Innsbruck, Austria (Tuesday 15 April 1986)] Thin Film Technologies II - Thin Film Refractive Index Determination By Different Techniques

✍ Scribed by Emiliani, G; Masetti,, E; Piegari, A; Jacobsson, J. Roland

No coin nor oath required. For personal study only.

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