SPIE Proceedings [SPIE 16th International Workshop on Physics of Semiconductor Devices - Kanpur, India (Monday 19 December 2011)] 16th International Workshop on Physics of Semiconductor Devices - An analytical modeling approach for a gate all around (GAA) tunnel field effect transistor (TFET)

✍ Scribed by Narang, Rakhi; Saxena, Manoj; Gupta, R. S.; Gupta, Mridula; Katiyar, Monica; Mazhari, B.; Mohapatra, Y N.

• Book ID: 120474956
• Publisher: SPIE
• Year: 2012
• Weight: 356 KB
• Volume: 8549
• Category: Article
• DOI: 10.1117/12.925534