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Specular and off-specular anomalous X-ray scattering as quantitative structural probes of multilayers

✍ Scribed by H.E. Fischer; H. Fischer; O. Durand; O. Pellegrino; S. Andrieu; M. Piecuch; S. Lefebvre; M. Bessière


Book ID
113284805
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
494 KB
Volume
97
Category
Article
ISSN
0168-583X

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Combination of specular and off-specular
✍ de Bernabé, A.; Capitán, M. J.; Fischer, H. E.; Quirós, C.; Prieto, C.; Colino, 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 175 KB 👁 2 views

The use of resonant low-angle x-ray di †raction, combining specular and o †-specular scans, has been used to characterize accurately and self-consistently a set of magnetron-sputtered Co/Cu multilayers. This study has permitted their mesoscopic structure and quality of interfaces to be determined. M