Structural Parameters of Multilayers as Deduced from X-ray Specular Reflectivity: Effect of Statistical Thickness Fluctuations

✍ Scribed by Manciu, M. ;Kordos, P. ;Hartdegen, H. ;Mānāilā, R.

• Book ID: 114501122
• Publisher: International Union of Crystallography
• Year: 1996
• Tongue: English
• Weight: 568 KB
• Volume: 29
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889896006358