## Abstract Coβdoped TiO~2~ films were characterized by spectroscopic ellipsometry to determine their thickness, deposition rate and optical properties as function of substrate temperature and background gas composition. To fit the data we used a combination of a single TaucβLorentz oscillator with
Spectroscopic study of polycrystalline TiO2 doped with vanadium
β Scribed by A. I. Kokorin; V. M. Arakelyan; V. M. Arutyunian
- Book ID
- 110420684
- Publisher
- Springer
- Year
- 2003
- Tongue
- English
- Weight
- 246 KB
- Volume
- 52
- Category
- Article
- ISSN
- 1573-9171
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