Spectroscopic ellipsometry study of Co-d
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Águas, H. ;Popovici, N. ;Pereira, L. ;Conde, O. ;Branford, W. R. ;Cohen, L. F. ;
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Article
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2008
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John Wiley and Sons
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English
⚖ 387 KB
## Abstract Co‐doped TiO~2~ films were characterized by spectroscopic ellipsometry to determine their thickness, deposition rate and optical properties as function of substrate temperature and background gas composition. To fit the data we used a combination of a single Tauc–Lorentz oscillator with