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Spectroscopic investigation of buried interfaces and liquids with soft X-rays

โœ Scribed by C. Heske

Book ID
106019131
Publisher
Springer
Year
2004
Tongue
English
Weight
865 KB
Volume
78
Category
Article
ISSN
1432-0630

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โœ S Mankefors; PO Nilsson; J Kanski; K Karlsson ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 403 KB

## Calculations of the soft x-ray emission spectrum have been carried out on a buried Si(lO0) layer in GaAs and compared with experimental data. We find that Si occupies Ga-as well as As-sites and that the local density of states is different for these two cases.