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Soft X-ray spectroscopic investigation of the density of states in palladium

✍ Scribed by J. Eggs; K. Ulmer


Book ID
107984721
Publisher
Elsevier Science
Year
1968
Tongue
English
Weight
141 KB
Volume
26
Category
Article
ISSN
0375-9601

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## Abstract The non‐destructive characterization of intrinsic stress is very important to evaluate the reliability of devices based on diamond‐like carbon (DLC) films. Whereas the only requirement for the X‐ray diffraction method is a crystalline state of specimen, Raman spectroscopic stress analys