Spectroscopic ellipsometry : practical application to thin film characterization

✍ Scribed by Hilfiker, James N.; Tompkins, Harland G

• Publisher: Momentum Press
• Year: 2016
• Tongue: English
• Leaves: 194
• Series: Materials characterization and analysis collection
• Category: Library

✦ Synopsis

Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from subnanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. It follows in the footsteps of two previous books written by one of the authors with important updates to emphasize modern instrumentation and applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself. Read more...

Abstract: Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from subnanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. It follows in the footsteps of two previous books written by one of the authors with important updates to emphasize modern instrumentation and applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself

✦ Table of Contents

Content: Perspective, previous works, and purpose of this volume --
Basic physical phenomena --
Spectroscopic ellipsometry components and instrumentation --
General data features --
Representing optical functions --
Optical data analysis --
Transparent thin films --
Roughness --
Very thin films --
Thin films with absorbing spectral regions --
Metallic films --
Multilayer thin film stacks.

✦ Subjects

Ellipsometry;Thin films;Measurement;Spectrum analysis;Measurement