Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films

✍ Scribed by Wolstenholme, John

• Publisher: Momentum Press
• Year: 2015
• Tongue: English
• Leaves: 256
• Series: Materials characterization and analysis collection
• Category: Library

✦ Synopsis

This book discusses the use of Auger electron spectroscopy (AES) and scanning Auger microscopy for the characterization of a wide range of technological materials, including, metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high-resolution elemental imaging and compositional depth profiling is illustrated and the application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative terms. Major components of typical Auger spectrometers are also described. The book discusses other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, X-ray spectroscopy, as well as the relationship between AES and other analysis techniques

✦ Table of Contents

Content: 1. Introduction --
2. The interaction of electrons with solid materials --
3. AES methodologies --
4. Instrumentation for auger analysis --
5. Auger electron spectroscopy in materials analysis --
6. Analytical methods for the characterization of materials --
Appendix 1. Abbreviations and acronyms --
Appendix 2. Quantum numbers --
Appendix 3. Comparison of surface and thin film analysis techniques --
Appendix 4. Standardization in surface analysis --
Appendix 5. Sources of the figures --
Further reading --
Index.

✦ Subjects

Auger electron spectroscopy. analytical methods Auger electron spectroscopy (AES) Auger spectrometers chemical imaging depth profiling energy analyzer interface analysis materials analysis microanalysis nanoanalysis scanning Auger microscopy (SAM) secondary electron microsc