This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know a
Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films
โ Scribed by Charles Evans, Richard Brundle, Wilson
- Publisher
- Butterworth-Heinemann
- Year
- 1992
- Tongue
- English
- Leaves
- 782
- Series
- Materials Characterization Series
- Category
- Library
No coin nor oath required. For personal study only.
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