This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know a
Encyclopedia Of Materials Characterization - Surfaces, Interfaces, Thin Fi
โ Scribed by Brundle C.R.
- Publisher
- elsevier
- Year
- 1992
- Tongue
- English
- Leaves
- 782
- Category
- Library
No coin nor oath required. For personal study only.
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