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Spectroscopic ellipsometric characterization of organic films obtained via organic vapor phase deposition

✍ Scribed by C. Himcinschi; N. Meyer; S. Hartmann; M. Gersdorff; M. Friedrich; H.-H. Johannes; W. Kowalsky; M. Schwambera; G. Strauch; M. Heuken; D.R.T. Zahn

Publisher: Springer
Year: 2005
Tongue: English
Weight: 474 KB
Volume: 80
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s00339-004-2973-7

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