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Speckle decorrelation in surface profilometry by wavelength scanning interferometry

✍ Scribed by Yamaguchi, Ichirou ;Yamamoto, Akihiro ;Kuwamura, Susumu


Book ID
115347507
Publisher
The Optical Society
Year
1998
Tongue
English
Weight
179 KB
Volume
37
Category
Article
ISSN
1559-128X

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We have applied wavelength scanning interferometry to Fizeau interferometer for surface proΓΏlometry. This interferometer is free from ambiguity of the sign in the measurement result. It is more compact in setup than the Michelson interferometer used previously. Experimental results from a step and a