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Spatial phase shifting for pure in-plane displacement and displacement-derivative measurements in electronic speckle pattern interferometry (ESPI)

✍ Scribed by Sirohi, R. S. ;Burke, J. ;Helmers, H. ;Hinsch, K. D.

Book ID
115346281
Publisher
The Optical Society
Year
1997
Tongue
English
Weight
1014 KB
Volume
36
Category
Article
ISSN
1559-128X

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