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Electronic speckle pattern interferometry for simultaneous measurement of out-of-plane displacement and slope

✍ Scribed by Mohan, N. Krishna; Saldner, H.; Molin, N.-E.

Book ID
115419964
Publisher
Optical Society of America
Year
1993
Tongue
English
Weight
446 KB
Volume
18
Category
Article
ISSN
0146-9592

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