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Spatial distribution of interface traps in DeMOS transistors

✍ Scribed by Moens, P.; Vlachakis, B.; Bauwens, F.; De Schepper, L.

Book ID: 118161089
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 203 KB
Volume: 25
Category: Article
ISSN: 0741-3106
DOI: 10.1109/led.2004.832533

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