✦ LIBER ✦

Profiling interface traps in MOS transistors by the DC current-voltage method

✍ Scribed by Chih-tang Sah; A. Neugroschel; K. Han; J. Kavalieros

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Separation of interface and nonuniform o

✍ Kavalieros, J.T.; Chih-Tang Sah 📂 Article 📅 1996 🏛 IEEE 🌐 English ⚖ 620 KB

Separation and Determination of the Inte

✍ Khoi, Phan Hong ;Minh, Phan Ngoc ;Binh, Le Thi Thanh ;Dung, Hoang Anh ;Tuyen, Le 📂 Article 📅 1993 🏛 John Wiley and Sons 🌐 English ⚖ 270 KB

Influence of Al2O3 dielectrics on the tr

✍ Jakschik, S.; Avellan, A.; Schroeder, U.; Bartha, J.W. 📂 Article 📅 2004 🏛 IEEE 🌐 English ⚖ 200 KB

On the profile of frequency and voltage

✍ S. Demirezen; Ş. Altındal; S. Özçelik; E. Özbay 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 957 KB