Semiconductor yield data is binary by nature since an integrated circuit (IC), or die, can only pass or fail a particular test. Still, many people rely on simple linear regression to analyse this type of data, which can produce incorrect results, e.g. negative yield predictions. We discuss the use o
Spatial correlation of chaotic and hyperchaotic dynamics in a semiconductor experiment
β Scribed by A. Cenys; K. Pyragas; J. Peinke; J. Parisi; R. Richter; A. Kittel
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 505 KB
- Volume
- 164
- Category
- Article
- ISSN
- 0375-9601
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