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Some electrical properties of RF sputtered CdS thin films

โœ Scribed by El Akkad, T. ;Abdel Naby, M. ;Felimban, A.


Publisher
John Wiley and Sons
Year
1986
Tongue
English
Weight
140 KB
Volume
95
Category
Article
ISSN
0031-8965

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Trap Levels in RF Sputtered CdS Thin Fil
โœ Ashour, H. ;El Akkad, F. ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 70 KB ๐Ÿ‘ 2 views

The trap levels in CdS thin films prepared by rf magnetron sputtering have been investigated using Photoinduced Current Transient Spectroscopy (PICTS). Trap levels in the range 0.08-1.06 eV have been detected. Those levels are tentatively attributed to native defects and foreign impurities (particul