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Some aspects of the X-ray structural characterization of (Ga1−xAlxAs)n1(GaAs)n2/GaAs(001) superlattices

✍ Scribed by Kervarec, J. ;Baudet, M. ;Caulet, J. ;Auvray, P. ;Emery, J. Y. ;Regreny, A.

Book ID
114499644
Publisher
International Union of Crystallography
Year
1984
Tongue
English
Weight
925 KB
Volume
17
Category
Article
ISSN
0021-8898

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✍ Jose Fayos; Mercedes Perez-Mendez 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 225 KB

Differences between In diffusion through InAs/AIAs and InAs/GaAs interfaces have been studied by X-ray diffraction in two crystals grown on \(\mathrm{GaAs}(001)\) substrates by atomic layer molecular beam epitaxy. The two samples were designed to include one InAs layer into an AlAs/GaAs superlattice