Soft X-ray spectromicroscopy beamline at the CLS: Commissioning results

✍ Scribed by K.V. Kaznatcheev; Ch. Karunakaran; U.D. Lanke; S.G. Urquhart; M. Obst; A.P. Hitchcock

• Book ID: 104066459
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 857 KB
• Volume: 582
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2007.08.083

✦ Synopsis

The soft X-ray spectromicroscopy beamline (SM) at the Canadian Light Source (CLS) is a dedicated spectromicroscopy facility, consisting of an elliptically polarized undulator (EPU), a beamline based on a collimated PGM optimized for 100-2000 eV range and two end stations: scanning transmission X-ray microscope (STXM) and roll-in X-ray photoemission electron microscope (X-PEEM, from Elmitec GmbH). The overall system has achieved its design parameters with an on-sample flux of $10 8 ph/s@R ¼ 3000, 0.5 A in STXM and $10 12 ph/s@R ¼ 3000, 0.5 A in the PEEM, in each case at a spatial resolution exceeding 40 nm. It can also provide an energy resolving power above 10,000. A careful EPU calibration procedure enables advanced polarization measurements.